Thesis supervisor: Emil Agócs
Location of studies (in Hungarian): MTA EK Abbreviation of location of studies: MTA
Description of the research topic:
Optical ellipsometry has been found to be a promising technique, allowing non-destructive measurement of material and geometrical properties of micro and nano systems. A target is illuminated by light with well-defined polarization states and a number of field components of the reflected and/or transmitted light are measured. Basically an ellipsometer measures the change of polarization of an incident beam during the reflection caused by a sample. Since the measured light carries no direct information about the measured system, inverse techniques or a series of approximations combined with a test sample have to be used to reconstruct parameters of the system.
In this topic the candidate can focus on the optical model developments. Different 2D and 3D nano-optical systems (from sensor application area) can be designed and simulated using commercially available and home made software’s
In the other hand the candidate can work on the global searching problem and investigate alternative methods to improve the searching process (like integrate the neural-net method into the analysis).
Required language skills: english Further requirements: good experience in optics, affiliation for programming
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