High resolution electron backscatter diffraction (HR-EBSD) is a recently developed new method to determine the local stress state developing in plastically deformed crystalline materials. Among other microstructural parameter with HR-EBSD one can determine the statistically stored, and geometrically necessary dislocation densities, and the correlation properties of the stress map obtained. Since the method is new, there are several open problems that have to be resolved before the technique can be applied in a routine way. One of the aim of the PhD project proposed is to further develop the method. Measurements will be carried out on different deformed single crystals and pillars with micron size (micropillar).
előírt nyelvtudás: angol további elvárások: Basic knowledge in scanning electron microscopy, MSc in physics or materials science
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