témavezető: Petrik Péter
helyszín (magyar oldal): MTA EK helyszín rövidítés: MTA
A kutatási téma leírása:
The development of thin films and surface nanostructures is of primary importance not only in microelectronics but also for sensors and solar cells. In these technologies besides the materials (e.g. oxides for sensing) their structure (e.g. 2D materials, biological macromolecules) is also a subject of intensive research. In order to develop these kinds of materials and structures, special measurement methods are needed. The aim of the proposed research is to use and develop optical characterization tools that are capable of measuring with a sub-nanometer and sub-second resolution, making it suitable for the monitoring of surface processes on the nanoscale. The high speed, the special arrangements and preparation methods make it possible to study large surfaces with high resolution, utilizing e.g. the combinatorial materials science approach, which creates a large range of compositions that can be investigated by a lateral scan on the sample surface. The candidate should focus on one or two possible materials science or structural characterization topics related to the above problems and techniques, as well as develop the characterization methods and its applications. Further information: http://www.ellipsometry.hu.
további elvárások: Analytical thinking, independent problem solving capabilities. Knowledge of programming languages such as C, Python or MATLAB is an advantage.
felvehető hallgatók száma: 1
Jelentkezési határidő: 2019-05-30
2024. IV. 17. ODT ülés Az ODT következő ülésére 2024. június 14-én, pénteken 10.00 órakor kerül sor a Semmelweis Egyetem Szenátusi termében (Bp. Üllői út 26. I. emelet).
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