Thesis supervisor: Miklós Fried
Location of studies (in Hungarian): Institute of Technical Physics and Materials Science, Centre for Energy Research Abbreviation of location of studies: EKMFA
Description of the research topic:
Non-destructive analysing tools are needed at all stages of thin film photovoltaic (PV) development, and on production lines. In thin film PV, layer thicknesses, micro-structure, composition, layer optical properties, and their uniformity serve as an important starting point in the evaluation of the performance of the cell or module. An important focus is to express the dielectric functions of each component material in terms of a handful of wavelength independent parameters whose variation can cover all process variants of that material. With the resulting database, spectroscopic ellipsometry coupled with multilayer analysis can be developed for on-line point-by-point mapping and imaging.
The aim of this work is to make prototypes for this optical mapping using only cheap parts: mobile phones, tablets, monitors. The basis of the work a patent (from our Institute): Horváth, Z Gy ; Juhász, G ; Fried, M ; Major, C ; Petrik, P: Imaging optical inspection device with a pinhole camera; EP2160591B1, Submission Number: PCT/HU2008/000058 , NSZO: G01N21/8422 , Country of patent: Európa
The task of the student: making the prototype, programming the data collection and data processing software, making measurements on selected samples and determining the precision of the prototype.
Deadline for application: 2021-05-31
2024. IV. 17. ODT ülés Az ODT következő ülésére 2024. június 14-én, pénteken 10.00 órakor kerül sor a Semmelweis Egyetem Szenátusi termében (Bp. Üllői út 26. I. emelet).
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