Thesis supervisor: Miklós Fried
Location of studies (in Hungarian): Institute of Technical Physics and Materials Science, Centre for Energy Research Abbreviation of location of studies: EKMFA
Description of the research topic:
The physical, chemical and structural properties of the cutting-edge materials are strongly dependent on their composition. The common procedure to reveal the properties of concentration dependent phases is the preparation of numerous two (or more)-component samples, one for each CA/CB=1-A composition, and the investigation of these individuals. This is a low efficiency procedure that costs enormous time of man and machine. Contrarily, using the combinatorial material synthesis approach, materials libraries can be produced in one experiment that contain up to several hundreds or thousands of samples on a single substrate. In order to identify optimized material structures in an efficient way, adequate automated micro-spot material characterization tools have to be applied. The preparation devices (DC magnetron, pulsed mode reactive DC magnetron and biased RF sputtering systems as well as laser ablation deposition system) and characterization instruments (Spectroscopic Ellipsometry - SE, Rutherford Backscattering Spectrometry - RBS, Transmission Electron Microscopy - TEM, Scanning Electron Microscopy - SEM, Atomic Force Microscopy - AFM) which can be used in MFA offer powerful tools for the fabrication and processing of materials libraries as well as for accelerated material characterization on appropriate planar substrates such as Si or oxidized Si wafers. These methods can help to search more efficient advanced functional materials for micro- and optoelectronics, energy converters (solar cells) or different (optical or gas) sensor systems.
Deadline for application: 2021-05-31
2024. IV. 17. ODT ülés Az ODT következő ülésére 2024. június 14-én, pénteken 10.00 órakor kerül sor a Semmelweis Egyetem Szenátusi termében (Bp. Üllői út 26. I. emelet).
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