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Personal data sheet |
Print preview VALIDITY EXPIRED personal data approved: 2021. II. 02. Publications |
2017
from data base, 2018. I. 02. |
Udvardi Péter, Radó János, Straszner András, Ferencz János, Hajnal Zoltán, Soleimani Saeedeh, Schneider Michael, Schmid Ulrich, Révész Péter, Volk János: Spiral-Shaped Piezoelectric MEMS Cantilever Array for Fully Implantable Hearing Systems, MICROMACHINES 8: (10) Paper 311. 13 p. type of document: Journal paper/Article language: English DOI |
2017
from data base, 2018. I. 02. |
Bíró F, Hajnal Z, Dücső C, Bársony I: The critical impact of temperature gradients on Pt filament failure, MICROELECTRONICS RELIABILITY 78: pp. 118-125. type of document: Journal paper/Article language: English DOI |
2017
from data base, 2018. I. 02. |
Pothorszky Szilárd, Zámbó Dániel, Szekrényes Dániel, Hajnal Zoltán, Deák András: Detecting patchy nanoparticle assembly at the single-particle level, NANOSCALE 9: (29) pp. 10344-10349. type of document: Journal paper/Article language: English DOI |
2014
from data base, 2018. I. 02. |
I Bársony, Cs Dücső, P Fürjes, F Riesz, Z Hajnal, G Battistig: Membrane Platforms for Sensors, PROCEDIA ENGINEERING 87: pp. 871-878. type of document: Journal paper/Review paper language: English URL |
2014
from data base, 2018. I. 02. |
Biró F, Dücso C, Hajnal Z, Riesz F, Pap AE, Bársony I: Thermo-mechanical design and characterization of low dissipation micro-hotplates operated above 500 °C, MICROELECTRONICS JOURNAL 45: (12) pp. 1822-1828. type of document: Journal paper/Article number of independent citations: 2 language: English URL |
2013
from data base, 2018. I. 02. |
Fekete Z, Hajnal Z, Márton G, Fürjes P, Pongrácz QA: Fracture analysis of silicon microprobes designed for deep-brain stimulation., MICROELECTRONIC ENGINEERING 103: pp. 160-166. type of document: Journal paper/Article number of independent citations: 3 language: English DOI |
2003
from data base, 2018. I. 02. |
Szucs B, Gali A, Hajnal Z, Deak P, Van de Walle CG: Physics and chemistry of hydrogen in the vacancies of semiconductors, PHYSICAL REVIEW B 68: (8) Paper 085202. 10 p. type of document: Journal paper/Article number of independent citations: 15 language: English URL |
2002
from data base, 2018. I. 02. |
Frauenheim T, Seifert G, Elstner M, Niehaus T, Kohler C, Amkreutz M, Sternberg M, Hajnal Z, Di Carlo A, Suhai S: Atomistic simulations of complex materials: ground-state and excited-state properties, JOURNAL OF PHYSICS-CONDENSED MATTER 14: (11) pp. 3015-3047. type of document: Journal paper/Review paper number of independent citations: 309 language: English URL |
1999
from data base, 2018. I. 02. |
Hajnal Z, Miro J, Kiss G, Reti F, Deak P, Herndon RC, Kuperberg JM: Role of oxygen vacancy defect states in the n-type conduction of beta-Ga2O3, JOURNAL OF APPLIED PHYSICS 86: (7) pp. 3792-3796. type of document: Journal paper/Article number of independent citations: 108 language: English URL |
1998
from data base, 2018. I. 02. |
Hajnal Z, Deak P, Kohler T, Kaschner R, Frauenheim T: Theoretical study of the luminescent substoichiometric silicon oxides (SiOx), SOLID STATE COMMUNICATIONS 108: (2) pp. 93-97. type of document: Journal paper/Article number of independent citations: 20 language: English URL |
| Number of independent citations to these publications: | 457 |
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