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personal data approved: 2019. XI. 25.
Personal data
Ferenc Riesz
name Ferenc Riesz
name of institution
doctoral school
BME Doctoral School of Physics (Academic staff member)
Contact details
E-mail address rieszmfa.kfki.hu
phone number +36 1 392-2222/3156
own web page
Academic title
scientific degree, title Ph.D.
year degree was obtained 1994
discipline to which degree belongs electrical engineering
institution granting the degree MTA Tudományos Minősítő Bizottság (to be translated)
scientific degree, title CSc
year degree was obtained 1994
discipline to which degree belongs
institution granting the degree HAS
Employment
2015 - MTA Energiatudományi Kutatóközpont, Műszaki Fizikai és Anyagtudományi Intézet (research institute, not university)
other (not specified) (tudományos főmunkatárs)
Thesis topic supervisor
number of doctoral students supervised until now 1
number of students who fulfilled course requirements 1
students who obtained their degrees:
István Endre Lukács PhD 2006  DSP1-BME

  Thesis topic proposals
Research
research area physics and technology of semiconductors, optical metrology of flat surfaces, Makyoh topography
research field in which current research is conducted electrical engineering
physics
Publications
2019

Riesz Ferenc: The effects of the global surface curvature on Makyoh-topogaphy imaging, Photonics Letters of Poland 11: (1) pp. 4-6.
type of document: Journal paper/Article
language: English
URL 
2018

Riesz Ferenc: Structured-illumination Makyoh-topography: optimum grid position and its constraints, SURFACE TOPOGRAPHY: METROLOGY AND PROPERTIES 6: (4) 045009
type of document: Journal paper/Article
language: English
URL 
2016

Bosi M, Attolini G, Negri M, Ferrari C, Buffagni E, Frigeri C, Calicchio M, Pecz B, Riesz F, Cora I, Osvath Z, Jiang L, Borionetti G: Defect structure and strain reduction of 3C-SiC/Si layers obtained with the use of a buffer layer and methyltrichlorosilane addition, CRYSTENGCOMM 18: (15) pp. 2770-2779.
type of document: Journal paper/Article
number of independent citations: 2
language: English
URL 
2014

Ryć L, Barna A, Calcagno L, Földes IB, Parys P, Riesz F, Rosińsk M, Szatmári S, Torrisi L: Measurement of ion emission from plasmas obtained with a 600 fs KrF laser, PHYSICA SCRIPTA T161: 014032
type of document: Journal paper/Article
number of independent citations: 1
language: English
URL 
2014

Biró F, Dücso C, Hajnal Z, Riesz F, Pap AE, Bársony I: Thermo-mechanical design and characterization of low dissipation micro-hotplates operated above 500 °C, MICROELECTRONICS JOURNAL 45: (12) pp. 1822-1828.
type of document: Journal paper/Article
number of independent citations: 4
language: English
URL 
2000

Riesz F: Geometrical optical model of the image formation in Makyoh (magic-mirror) topography, JOURNAL OF PHYSICS D-APPLIED PHYSICS 33: (23) pp. 3033-3040.
type of document: Journal paper/Article
number of independent citations: 25
language: English
URL 
1996

Riesz F: Crystallographic tilting in high-misfit (100) semiconductor heteroepitaxial systems, JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY A-VACUUM SURFACES AND FILMS 14: (2) pp. 425-430.
type of document: Journal paper/Article
number of independent citations: 40
language: English
URL 
1996

Riesz F: Crystallographic tilting in lattice-mismatched heteroepitaxy: A Dodson-Tsao relaxation approach, JOURNAL OF APPLIED PHYSICS 79: (8) pp. 4111-4117.
type of document: Journal paper/Article
number of independent citations: 25
language: English
URL 
1991

Riesz F, Lischka K, Rakennus K, Hakkarainen T, Pesek A: Tilting of lattice planes in InP epilayers grown on miscut GaAs substrates: the effect of initial growth conditions, JOURNAL OF CRYSTAL GROWTH 114: (1-2) pp. 127-132.
type of document: Journal paper/Article
number of independent citations: 20
language: English
URL 
1991

Pesek A, Hingerl K, Riesz F, Lischka K: Lattice misfit and relative tilt of lattice planes in semiconductor heterostructures, SEMICONDUCTOR SCIENCE AND TECHNOLOGY 6: (7) pp. 705-708.
type of document: Journal paper/Article
number of independent citations: 30
language: English
URL 
Number of independent citations to these publications:147 
Scientometric data
list of publications and citations
number of scientific publications that meet accreditation criteria:
152
number of scientific publications:
168
monographs and professional books:
0
monographs/books in which chapters/sections were contributed:
1 
number of independent citations to scientific publications and creative works:
428
further relevant information regarding accreditation (in Hungarian)
Nemzetközi szabadalom: Lukács IE (23%), Makai JP (24%), Pfitzner L (5%), Riesz F (34%), Szentpáli B (14%) Apparatus and measurement procedure for the fast, quantitative, non-contact topographic investigation of semiconductor wafers and other mirror like surfaces European Patent EP 1 434 981 B1, July 5, 2006 US Patent 7,133,140 B2, November 7, 2006 (to be translated)


2020. VI. 25.
ODT ülés
Az ODT következő ülésére 2020. július 10-én 10.00 órakor kerül sor a Semmelweis Egyetem Szenátusi termében (Bp. Üllői út 26. I. emelet).

 
All rights reserved © 2007, Hungarian Doctoral Council. Doctoral Council registration number at commissioner for data protection: 02003/0001. Program version: 2.2358 ( 2017. X. 31. )