Print previewpersonal data approved: 2021. I. 04. Publications |
2020
 from data base, 2021. I. 04. |
Kalas B, Zolnai Z, Safran G, Serenyi M, Agocs E, Lohner T, Nemeth A, Khanh NQ, Fried M, Petrik P: Micro-combinatorial sampling of the optical properties of hydrogenated amorphous Si (1-x) Ge (x) for the entire range of compositions towards a database for optoelectronics, SCIENTIFIC REPORTS 10: (1) 19266 type of document: Journal paper/Article language: English URL |
2018
 from data base, 2021. I. 04. |
Zolnai Zs, Zámbó D, Osváth Z, Nagy N, Fried M, Németh A, Pothorszky Sz, Szekrényes DP, Deák A: Gold Nanorod Plasmon Resonance Damping Effects on a Nanopatterned Substrate, JOURNAL OF PHYSICAL CHEMISTRY C 122: (43) pp. 24941-24948. type of document: Journal paper/Article number of independent citations: 2 language: English URL |
2017
 from data base, 2021. I. 04. |
Fodor Bálint, Defforge Thomas, Agócs Emil, Fried Miklós, Gautier Gaël, Petrik Péter: Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires, APPLIED SURFACE SCIENCE 421: pp. 397-404. type of document: Journal paper/Article number of independent citations: 12 language: English URL |
2016
 from data base, 2021. I. 04. |
Fodor Balint, Agocs Emil, Bardet Benjamin, Defforge Thomas, Cayrel Frederic, Alquier Daniel, Fried Miklos, Gautier Gael, Petrik Peter: Porosity and thickness characterization of porous Si and oxidized porous Si layers – an ultraviolet-visible-mid infrared ellipsometry study, MICROPOROUS AND MESOPOROUS MATERIALS 227: pp. 112-120. type of document: Journal paper/Article number of independent citations: 11 language: English URL |
2016
 from data base, 2021. I. 04. |
Judit Nador, Benjamin Kalas, Andras Saftics, Emil Agocs, Peter Kozma, Laszlo Korosi, Inna Szekacs, Miklos Fried, Robert Horvath, Peter Petrik: Plasmon-enhanced two-channel in situ Kretschmann ellipsometry of protein adsorption, cellular adhesion and polyelectrolyte deposition on titania nanostructures, OPTICS EXPRESS 24: (5) pp. 4812-4823. type of document: Journal paper/Article number of independent citations: 5 language: English URL |
2014
 from data base, 2017. XI. 29. |
Ambalanath Shan, M Fried, G Juhasz, C Major, O Polgar, A Nemeth, P Petrik, Lila R Dahal, Jie Chen, Zhiquan Huang, N J Podraza, R W Collins: High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin Film Photovoltaics, IEEE JOURNAL OF PHOTOVOLTAICS 4: (1) pp. 355-361. pp. 355-361. type of document: Journal paper/Article number of independent citations: 9 language: English URL |
2009
 from data base, 2017. XI. 29. |
Major C, Nemeth A, Radnoczi G, Czigany Z, Fried M, Labadi Z, Barsony I: Optical and electrical characterization of aluminium doped ZnO layers, APPLIED SURFACE SCIENCE 255: (21) pp. 8907-8912. type of document: Journal paper/Article number of independent citations: 28 language: English DOI |
1997
 from data base, 2017. XI. 29. |
Krotkus A, Grigoras K, Pacebutas V, Barsony I, Vazsonyi E, Fried M, Szlufcik J, Nijs J, Levy Clement C: Efficiency improvement by porous silicon coating of multicrystalline solar cells, SOLAR ENERGY MATERIALS AND SOLAR CELLS 45: (3) pp. 267-273. type of document: Journal paper/Article number of independent citations: 60 language: English DOI |
1992
 from data base, 2017. XI. 29. |
FRIED M, LOHNER T, AARNINK WAM, HANEKAMP LJ, VANSILFHOUT A: DETERMINATION OF COMPLEX DIELECTRIC FUNCTIONS OF ION-IMPLANTED AND IMPLANTED-ANNEALED AMORPHOUS-SILICON BY SPECTROSCOPIC ELLIPSOMETRY, JOURNAL OF APPLIED PHYSICS 71: (10) pp. 5260-5262. type of document: Journal paper/Article number of independent citations: 80 language: English DOI |
1992
 from data base, 2017. XI. 29. |
FRIED M, LOHNER T, AARNINK WAM, HANEKAMP LJ, VANSILFHOUT A: NONDESTRUCTIVE DETERMINATION OF DAMAGE DEPTH PROFILES IN ION-IMPLANTED SEMICONDUCTORS BY SPECTROSCOPIC ELLIPSOMETRY USING DIFFERENT OPTICAL-MODELS, JOURNAL OF APPLIED PHYSICS 71: (6) pp. 2835-2843. type of document: Journal paper/Article number of independent citations: 60 language: English DOI |
| Number of independent citations to these publications: | 267  |
|
|