Miklós Fried - ODT Personal data sheet


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Personal data sheet

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personal data approved: 2021. I. 04.

Personal data

name	Miklós Fried
name of institution	Budapest University of Technology and Economics University of Pannonia Universitas Budensis
doctoral school	BME Doctoral School of Physics (Academic staff member Az oktató a doktori iskola doktoranduszai számára oktat tantárgyat, és/vagy a doktori iskola megszavazta, hogy doktoranduszok számára kutatási témát írjon ki. ) BME George A. Olah Doctoral School of Chemistry and Chemical Technology (Academic staff member Az oktató a doktori iskola doktoranduszai számára oktat tantárgyat, és/vagy a doktori iskola megszavazta, hogy doktoranduszok számára kutatási témát írjon ki. ) PE Chemical Engineering and Material Sciences Doctoral School (Academic staff member Az oktató a doktori iskola doktoranduszai számára oktat tantárgyat, és/vagy a doktori iskola megszavazta, hogy doktoranduszok számára kutatási témát írjon ki. ) PE Doctoral School of Molecular- and Nanotechnologies (Core member) Council of the Doctoral School (external member) OE Doctoral School on Materials Science and Technologies (Academic staff member Az oktató a doktori iskola doktoranduszai számára oktat tantárgyat, és/vagy a doktori iskola megszavazta, hogy doktoranduszok számára kutatási témát írjon ki. )
the share of work in the different doctoral schools.	BME Doctoral School of Physics 1% BME George A. Olah Doctoral School of Chemistry and Chemical Technology 20% PE Chemical Engineering and Material Sciences Doctoral School 1% PE Doctoral School of Molecular- and Nanotechnologies 51% OE Doctoral School on Materials Science and Technologies 26% PE DSMN Council of the Doctoral School (external member) 1%
accreditation statement submitted to:	University of Pannonia

Contact details
E-mail address	friedmfa.kfki.hu
phone number	+36 20 549-2414
	own web page

Academic title
scientific degree, title	Ph.D.
year degree was obtained	1985
discipline to which degree belongs	physics
institution granting the degree	HAS
scientific degree, title	DSc
year degree was obtained	2005
discipline to which degree belongs	physics
institution granting the degree	HAS

Employment
1982 -	MTA EK Műszaki Fizikai és Anyagtudományi Kutatóintézet scientific consultant

Thesis topic supervisor

number of doctoral students supervised until now

number of students who fulfilled course requirements

students who obtained their degrees:

	Csaba Ferenc Major	PhD	2010	DSP1-BME
	Olivér Polgár	PhD	1999
(50%)	László Rédei	PhD	1998

Thesis topic proposals

Research
research area	solid-state physics, ellipsometry, thin films, ion implantation, nano-crystalline semiconductors, size-effects on optical properties, optical properties of biological materials
research field in which current research is conducted	material sciences physics

Publications

2020

Kalas B, Zolnai Z, Safran G, Serenyi M, Agocs E, Lohner T, Nemeth A, Khanh NQ, Fried M, Petrik P: Micro-combinatorial sampling of the optical properties of hydrogenated amorphous Si (1-x) Ge (x) for the entire range of compositions towards a database for optoelectronics, SCIENTIFIC REPORTS 10: (1) 19266
type of document: Journal paper/Article
language: English
URL

2018

Zolnai Zs, Zámbó D, Osváth Z, Nagy N, Fried M, Németh A, Pothorszky Sz, Szekrényes DP, Deák A: Gold Nanorod Plasmon Resonance Damping Effects on a Nanopatterned Substrate, JOURNAL OF PHYSICAL CHEMISTRY C 122: (43) pp. 24941-24948.
type of document: Journal paper/Article
number of independent citations: 2
language: English
URL

2017

Fodor Bálint, Defforge Thomas, Agócs Emil, Fried Miklós, Gautier Gaël, Petrik Péter: Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires, APPLIED SURFACE SCIENCE 421: pp. 397-404.
type of document: Journal paper/Article
number of independent citations: 12
language: English
URL

2016

Fodor Balint, Agocs Emil, Bardet Benjamin, Defforge Thomas, Cayrel Frederic, Alquier Daniel, Fried Miklos, Gautier Gael, Petrik Peter: Porosity and thickness characterization of porous Si and oxidized porous Si layers – an ultraviolet-visible-mid infrared ellipsometry study, MICROPOROUS AND MESOPOROUS MATERIALS 227: pp. 112-120.
type of document: Journal paper/Article
number of independent citations: 11
language: English
URL

2016

Judit Nador, Benjamin Kalas, Andras Saftics, Emil Agocs, Peter Kozma, Laszlo Korosi, Inna Szekacs, Miklos Fried, Robert Horvath, Peter Petrik: Plasmon-enhanced two-channel in situ Kretschmann ellipsometry of protein adsorption, cellular adhesion and polyelectrolyte deposition on titania nanostructures, OPTICS EXPRESS 24: (5) pp. 4812-4823.
type of document: Journal paper/Article
number of independent citations: 5
language: English
URL

2014

Ambalanath Shan, M Fried, G Juhasz, C Major, O Polgar, A Nemeth, P Petrik, Lila R Dahal, Jie Chen, Zhiquan Huang, N J Podraza, R W Collins: High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin Film Photovoltaics, IEEE JOURNAL OF PHOTOVOLTAICS 4: (1) pp. 355-361. pp. 355-361.
type of document: Journal paper/Article
number of independent citations: 9
language: English
URL

2009

Major C, Nemeth A, Radnoczi G, Czigany Z, Fried M, Labadi Z, Barsony I: Optical and electrical characterization of aluminium doped ZnO layers, APPLIED SURFACE SCIENCE 255: (21) pp. 8907-8912.
type of document: Journal paper/Article
number of independent citations: 28
language: English
DOI

1997

Krotkus A, Grigoras K, Pacebutas V, Barsony I, Vazsonyi E, Fried M, Szlufcik J, Nijs J, Levy Clement C: Efficiency improvement by porous silicon coating of multicrystalline solar cells, SOLAR ENERGY MATERIALS AND SOLAR CELLS 45: (3) pp. 267-273.
type of document: Journal paper/Article
number of independent citations: 60
language: English
DOI

1992

FRIED M, LOHNER T, AARNINK WAM, HANEKAMP LJ, VANSILFHOUT A: DETERMINATION OF COMPLEX DIELECTRIC FUNCTIONS OF ION-IMPLANTED AND IMPLANTED-ANNEALED AMORPHOUS-SILICON BY SPECTROSCOPIC ELLIPSOMETRY, JOURNAL OF APPLIED PHYSICS 71: (10) pp. 5260-5262.
type of document: Journal paper/Article
number of independent citations: 80
language: English
DOI

1992

FRIED M, LOHNER T, AARNINK WAM, HANEKAMP LJ, VANSILFHOUT A: NONDESTRUCTIVE DETERMINATION OF DAMAGE DEPTH PROFILES IN ION-IMPLANTED SEMICONDUCTORS BY SPECTROSCOPIC ELLIPSOMETRY USING DIFFERENT OPTICAL-MODELS, JOURNAL OF APPLIED PHYSICS 71: (6) pp. 2835-2843.
type of document: Journal paper/Article
number of independent citations: 60
language: English
DOI

Number of independent citations to these publications:

267

Scientometric data

list of publications and citations

number of scientific publications that meet accreditation criteria:

260

number of scientific publications:

244

monographs and professional books:

monographs/books in which chapters/sections were contributed:

scientific publications published abroad that meet the accreditation criteria:

221

publications not in Hungarian, published in Hungary, meeting the accreditation criteria:

number of independent citations to scientific publications and creative works:

1793