Print previewpersonal data approved: 2023. V. 15. Publications |
2022
 from data base, 2023. V. 15. |
Fried Miklos, Bogar Renato, Takacs Daniel, Labadi Zoltan, Horvath Zsolt Endre, Zolnai Zsolt: Investigation of Combinatorial WO3-MoO3 Mixed Layers by Spectroscopic Ellipsometry using Different Optical Models, NANOMATERIALS 12: (14) 2421 type of document: Journal paper/Article number of independent citations: 1 language: English URL |
2022
 from data base, 2023. V. 15. |
Kalas Benjamin, Sáfrán György, Serényi Miklós, Fried Miklós, Petrik Péter: Scanning-resonance optical sensing based on a laterally graded plasmonic layer – optical properties of Ag x Al 1 − x in the range of x = 0 to 1, APPLIED SURFACE SCIENCE 606: 154770 type of document: Journal paper/Article number of independent citations: 1 language: English URL |
2021
 from data base, 2023. V. 15. |
Romanenko Alekszej, Kalas Benjamin, Hermann Petra, Hakkel Orsolya, Illés Levente, Fried Miklós, Fürjes Peter, Gyulai Gergö, Petrik Peter: Membrane-Based In Situ Mid-Infrared Spectroscopic Ellipsometry: A Study on the Membrane Affinity of Polylactide-co-glycolide Nanoparticulate Systems, ANALYTICAL CHEMISTRY 93: (2) pp. 981-991. type of document: Journal paper/Article number of independent citations: 2 language: English URL |
2021
 from data base, 2023. V. 15. |
Kalas B, Ferencz K, Saftics A, Czigany Z, Fried M, Petrik P: Bloch surface waves biosensing in the ultraviolet wavelength range - Bragg structure design for investigating protein adsorption by in situ Kretschmann-Raether ellipsometry, APPLIED SURFACE SCIENCE 536: 147869 type of document: Journal paper/Article number of independent citations: 6 language: English URL |
2020
 from data base, 2023. V. 15. |
Kalas B, Zolnai Z, Safran G, Serenyi M, Agocs E, Lohner T, Nemeth A, Khanh NQ, Fried M, Petrik P: Micro-combinatorial sampling of the optical properties of hydrogenated amorphous Si (1-x) Ge (x) for the entire range of compositions towards a database for optoelectronics, SCIENTIFIC REPORTS 10: (1) 19266 type of document: Journal paper/Article number of independent citations: 6 language: English URL |
2014
 from data base, 2017. XI. 29. |
Ambalanath Shan, M Fried, G Juhasz, C Major, O Polgar, A Nemeth, P Petrik, Lila R Dahal, Jie Chen, Zhiquan Huang, N J Podraza, R W Collins: High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin Film Photovoltaics, IEEE JOURNAL OF PHOTOVOLTAICS 4: (1) pp. 355-361. pp. 355-361. type of document: Journal paper/Article number of independent citations: 9 language: English URL |
2009
 from data base, 2017. XI. 29. |
Major C, Nemeth A, Radnoczi G, Czigany Z, Fried M, Labadi Z, Barsony I: Optical and electrical characterization of aluminium doped ZnO layers, APPLIED SURFACE SCIENCE 255: (21) pp. 8907-8912. type of document: Journal paper/Article number of independent citations: 28 language: English DOI |
1997
 from data base, 2017. XI. 29. |
Krotkus A, Grigoras K, Pacebutas V, Barsony I, Vazsonyi E, Fried M, Szlufcik J, Nijs J, Levy Clement C: Efficiency improvement by porous silicon coating of multicrystalline solar cells, SOLAR ENERGY MATERIALS AND SOLAR CELLS 45: (3) pp. 267-273. type of document: Journal paper/Article number of independent citations: 60 language: English DOI |
1992
 from data base, 2017. XI. 29. |
FRIED M, LOHNER T, AARNINK WAM, HANEKAMP LJ, VANSILFHOUT A: DETERMINATION OF COMPLEX DIELECTRIC FUNCTIONS OF ION-IMPLANTED AND IMPLANTED-ANNEALED AMORPHOUS-SILICON BY SPECTROSCOPIC ELLIPSOMETRY, JOURNAL OF APPLIED PHYSICS 71: (10) pp. 5260-5262. type of document: Journal paper/Article number of independent citations: 80 language: English DOI |
1992
 from data base, 2017. XI. 29. |
FRIED M, LOHNER T, AARNINK WAM, HANEKAMP LJ, VANSILFHOUT A: NONDESTRUCTIVE DETERMINATION OF DAMAGE DEPTH PROFILES IN ION-IMPLANTED SEMICONDUCTORS BY SPECTROSCOPIC ELLIPSOMETRY USING DIFFERENT OPTICAL-MODELS, JOURNAL OF APPLIED PHYSICS 71: (6) pp. 2835-2843. type of document: Journal paper/Article number of independent citations: 60 language: English DOI |
| Number of independent citations to these publications: | 253  |
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