Emil Agócs - ODT Personal data sheet


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VALIDITY EXPIRED
personal data approved: 2021. I. 13.

Personal data

name	Emil Agócs
year of birth	1984
name of institution	Budapest University of Technology and Economics
doctoral school	BME Doctoral School of Physics (Academic staff member Az oktató a doktori iskola doktoranduszai számára oktat tantárgyat, és/vagy a doktori iskola megszavazta, hogy doktoranduszok számára kutatási témát írjon ki. )
the share of work in the different doctoral schools.	BME Doctoral School of Physics 100%

Contact details
E-mail address	agocs.emilenergia.mta.hu
phone number	+36 1 392-2502
	own web page

Academic title
scientific degree, title	Ph.D.
year degree was obtained	2015
discipline to which degree belongs	material sciences
institution granting the degree	University of Pannonia

Employment
2019 -	Technische Universität Braunschweig (research institute, not university) other (not specified) (PostDoc)
2016 -	National Institute of Standards and Technology (research institute, not university) other (not specified) (Guest Researcher)
2012 -	Energiatudományi Kutatóközpont other (not specified) (tudományos munkatárs)

Thesis topic supervisor
number of doctoral students supervised until now	0
number of students who fulfilled course requirements	0
students who obtained their degrees:
	Thesis topic proposals

Research
research area	Development of optical characterization methods (Spectroscopic Ellipsometry, Scaterometry, Optical microscopy, Biosensors)
research field in which current research is conducted	material sciences physics

Publications

2018

Agocs Emil, Attota Ravi Kiran: Enhancing optical microscopy illumination to enable quantitative imaging, SCIENTIFIC REPORTS 8: 4782
type of document: Journal paper/Article
language: English
URL

2017

Agocs Emil, Kozma Peter, Nador Judit, Hamori Andras, Janosov Milan, Kalas Benjamin, Kurunczi Sandor, Fodor Balint, Ehrentreich-Förster Eva, Fried Miklos, Horvath Robert, Petrik Peter: Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions, APPLIED SURFACE SCIENCE 421: pp. 289-294.
type of document: Journal paper/Article
number of independent citations: 1
language: English

2017

Agocs E, Zolnai Z, Rossall AK, van den Berg JA, Fodor B, Lehninger D, Khomenkova L, Ponomaryov S, Gudymenko O, Yukhymchuk V, Kalas B, Heitmann J, Petrik P: Optical and structural characterization of Ge clusters embedded in ZrO2, APPLIED SURFACE SCIENCE 421: pp. 283-288.
type of document: Journal paper/Article
language: English

2016

Fodor Balint, Agocs Emil, Bardet Benjamin, Defforge Thomas, Cayrel Frederic, Alquier Daniel, Fried Miklos, Gautier Gael, Petrik Peter: Porosity and thickness characterization of porous Si and oxidized porous Si layers – an ultraviolet-visible-mid infrared ellipsometry study, MICROPOROUS AND MESOPOROUS MATERIALS 227: pp. 112-120.
type of document: Journal paper/Article
number of independent citations: 6
language: English
URL

2015

Chandrappan J, Murray M, Kakkar T, Petrik P, Agocs E, Zolnai Z, Steenson DP, Jha A, Jose G: Target dependent femtosecond laser plasma implantation dynamics in enabling silica for high density erbium doping, SCIENTIFIC REPORTS 5: 14037
type of document: Journal paper/Article
number of independent citations: 4
language: English
URL

2014

Agocs E, Fodor B, Pollakowski B, Beckhoff B, Nutsch A, Jank M, Petrik P: Approaches to calculate the dielectric function of ZnO around the band gap, THIN SOLID FILMS 571: (3) pp. 684-688.
type of document: Journal paper/Article
number of independent citations: 13
language: English
URL

2013

Saftics András, Agócs Emil, Fodor Bálint, Patkó Dániel, Petrik Péter, Kolari Kai, Aalto Timo, Fürjes Péter, Horvath Robert, Kurunczi Sándor: Investigation of thin polymer layers for biosensor applications, APPLIED SURFACE SCIENCE 281: pp. 66-72.
type of document: Journal paper/Article
number of independent citations: 8
language: English

2013

Agocs E, Nassiopoulou AG, Milita S, Petrik P: Model dielectric function analysis of the critical point features of silicon nanocrystal films in a broad parameter range, THIN SOLID FILMS 541: pp. 83-86.
type of document: Journal paper/Article
number of independent citations: 1
language: English

2012

Korosi L, Papp S, Beke S, Pecz B, Horvath R, Petrik P, Agocs E, Dekany I: Highly transparent ITO thin films on photosensitive glass: sol-gel synthesis, structure, morphology and optical properties, APPLIED PHYSICS A - MATERIALS SCIENCE AND PROCESSING 107: (2) pp. 385-392.
type of document: Journal paper/Article
number of independent citations: 17
language: English

2011

Agocs E, Petrik P, Milita S, Vanzetti L, Gardelis S, Nassiopoulou AG, Pucker G, Balboni R, Fried M: Optical characterization of nanocrystals in silicon rich oxide superlattices and porous silicon, THIN SOLID FILMS 519: (9) pp. 3002-3005.
type of document: Journal paper/Article
number of independent citations: 5
language: English

Number of independent citations to these publications:

Scientometric data

list of publications and citations

number of scientific publications that meet accreditation criteria:

number of scientific publications:

monographs and professional books:

monographs/books in which chapters/sections were contributed:

number of independent citations to scientific publications and creative works:

158

2024. IV. 17.
ODT ülés
Az ODT következő ülésére 2024. június 14-én, pénteken 10.00 órakor kerül sor a Semmelweis Egyetem Szenátusi termében (Bp. Üllői út 26. I. emelet).