Print previewVALIDITY EXPIRED personal data approved: 2019. X. 29. Publications |
2014
 from data base, 2018. I. 24. |
L Dobos, B Pécz, L Tóth, Zs J Horváth, Z E Horváth, A L Tóth, M -A Poisson: Annealed Ti/Cr/Al contacts on n-GaN, VACUUM 100: pp. 46-49. type of document: Journal paper/Article number of independent citations: 5 language: English DOI |
2014
 from data base, 2018. I. 24. |
Horváth Zs J: Threshold//Flat-Band Voltage Hysteresis of Non-Volatile Semiconductor Memory Devices, In: Szerk.: Jose Carlos Dias Hysteresis: Types, Applications and Behavior Patterns in Complex Systems. New York: Nova Science Publishers, 2014. pp. 187-214. (Materials Science and Technologies) type of document: Part of book/Könyvfejezet (to be translated) language: English
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2013
 from data base, 2018. I. 24. |
Horváth ZsJ, Basa P, Molnár KZ, Jászi T, Pap AE, Molnár Gy, Dobos L, Tóth L, Pécz B: Charging Behaviour of Metal-Nitride-Oxide-Semiconductor Memory Structures with Embedded Si or Ge Nanocrystals, NANOSCIENCE AND NANOTECHNOLOGY LETTERS 5: (4) pp. 513-517. type of document: Journal paper/Article number of independent citations: 1 language: English URL |
2013
 from data base, 2018. I. 24. |
Horváth ZsJ, Basa P, Jászi T, Molnár KZ, Pap AE, Molnár Gy: Charging behavior of silicon nitride based non-volatile memory structures with embedded semiconductor nanocrystals, APPLIED SURFACE SCIENCE 269: pp. 23-28. type of document: Journal paper/Article number of independent citations: 2 language: English URL |
2013
 from data base, 2018. I. 24. |
Horváth ZsJ, Basa P, Molnár KZ, Molnár Gy, Jászi T, Pap AE: Effect of location of Si or Ge nanocrystals on the memory behavior of MNOS structures., PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES 51: pp. 104-110. type of document: Journal paper/Article number of independent citations: 6 language: English URL |
2005
 from data base, 2018. I. 24. |
Ayyildiz E, Cetin H, Horváth ZJ: Temperature dependent electrical characteristics of Sn/p-Si Schottky diodes, APPLIED SURFACE SCIENCE 252: (4) pp. 1153-1158. type of document: Journal paper/Article number of independent citations: 44 language: English DOI |
2004
 from data base, 2018. I. 24. |
Osvald J, Horvath ZJ: Theoretical study of the temperature dependence of electrical characteristics of Schottky diodes with an inverse near-surface layer, APPLIED SURFACE SCIENCE 234: (1-4) pp. 349-354. type of document: Journal paper/Article number of independent citations: 84 language: English DOI |
1996
 from data base, 2018. I. 24. |
Horváth ZJ: Comment on "Analysis of I-V measurements on CrSi2-Si Schottky structures in a wide temperature range", SOLID-STATE ELECTRONICS 39: (1) pp. 176-178. type of document: Journal paper/Article number of independent citations: 115 language: English DOI |
1995
 from data base, 2018. I. 24. |
HORVATH ZJ: LATERAL DISTRIBUTION OF SCHOTTKY-BARRIER HEIGHT - A THEORETICAL APPROACH, VACUUM 46: (8-10) pp. 963-966. type of document: Journal paper/Article number of independent citations: 25 language: English DOI |
1988
 from data base, 2018. I. 24. |
HORVATH ZJ: DOMINATION OF THE THERMIONIC-FIELD EMISSION IN THE REVERSE IV CHARACTERISTICS OF N-TYPE GAAS SCHOTTKY CONTACTS, JOURNAL OF APPLIED PHYSICS 64: (12) pp. 6780-6784. type of document: Journal paper/Article number of independent citations: 23 language: English
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| Number of independent citations to these publications: | 305  |
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