 Optical characterization of metal surfaces and thin films THESIS TOPIC PROPOSAL Institute: University of Debrecen mechanical engineering Pekár Imre Doctoral School of Mechanical Engineering Thesis supervisor: Péter Petrik Location of studies (in Hungarian): University of Debrecen Faculty of Engineering Abbreviation of location of studies: DE MK Description of the research topic: Thin layer physics traditionally has a wide range of tools for the high-sensitivity determination of the material properties of surfaces and thin films. These are mostly suitable for measuring the crystal structure, surface roughness, layer thickness, elemental composition and many other important parameters on the atomic and nanoscale. Within this, optical methods are suitable for process monitoring of interface phenomena. The goal of the research is to learn optical methods for examining surface oxidation, corrosion and other structural changes with nanometer thickness and tenth percentile refractive index sensitivity. Number of students who can be accepted: 1 Deadline for application: 2024-11-15 |