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Personal data sheet |
Print preview VALIDITY EXPIRED personal data approved: 2018. II. 09. Publications |
2016
from data base, 2016. XII. 09. |
M Serényi, T Lohner, G Sáfrán, J Szívós: Comparison in formation, optical properties and applicability of DC magnetron and RF sputtered aluminum oxide films, VACUUM 128: pp. 213-218. type of document: Journal paper/Article language: English URL |
2014
from data base, 2018. II. 09. |
Lohner T, Agócs E, Petrik P, Zolnai Z, Szilágyi E, Kovács I, Szőkefalvi-Nagy Z, Tóth L, Tóth AL, Illés L, Bársony I: Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration, THIN SOLID FILMS 571: (3) pp. 715-719. type of document: Journal paper/Article language: English Full text |
2014
from data base, 2016. XII. 09. |
Tivadar Lohner, K. Jagadeesh Kumar, Péter Petrik, Aryasomayajula Subrahmanyam, István Bársony: Optical analysis of room temperature magnetron sputtered ITO films by reflectometry and spectroscopic ellipsometry, JOURNAL OF MATERIALS RESEARCH 29: (14) pp. 1528-1536. type of document: Journal paper/Article number of independent citations: 1 language: English URL |
2014
from data base, 2018. II. 09. |
János Szívós, M Serényi, E Gergely-Fülöp, T Lohner, G Sáfrán: Nanopattern formation in UV laser treated a-AlOx and nc-Al/AlOx layers, VACUUM 109: pp. 200-205. type of document: Journal paper/Article language: English URL |
2013
from data base, 2016. XII. 09. |
T Lohner, P Csíkvári, P Petrik, G Hárs: Spectroellipsometric characterization of nanocrystalline diamond layers, APPLIED SURFACE SCIENCE 281: pp. 113-117. type of document: Journal paper/Article number of independent citations: 2 language: English URL |
2008
from data base, 2016. XII. 09. |
Szilagyi E, Petrik P, Lohner T, Koos AA, Fried M, Battistig G: Oxidation of SiC investigated by ellipsometry and Rutherford backscattering spectrometry, JOURNAL OF APPLIED PHYSICS 104: (1) Paper 014903. 7 p. type of document: Journal paper/Article number of independent citations: 18 language: English DOI |
2007
from data base, 2018. II. 09. |
Serenyi M, Lohner T, Petrik P, Frigeri C: Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy, THIN SOLID FILMS 515: (7-8) pp. 3559-3562. type of document: Journal paper/Article number of independent citations: 22 language: English URL |
2001
from data base, 2018. II. 09. |
Vazsonyi E, Szilagyi E, Petrik P, Horvath ZE, Lohner T, Fried M, Jalsovszky G: Porous silicon formation by stain etching, THIN SOLID FILMS 388: (1-2) pp. 295-302. type of document: Journal paper/Article number of independent citations: 97 language: English DOI |
2000
from data base, 2018. II. 09. |
Lohner T, Fried M, Petrik P, Polgar O, Gyulai J, Lehnert W: Ellipsometric characterization of oxidized porous silicon layer structures, MATERIALS SCIENCE AND ENGINEERING B - SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 69: (SI) pp. 182-187. type of document: Journal paper/Article number of independent citations: 29 language: English DOI |
1992
from data base, 2016. XII. 09. |
FRIED M, LOHNER T, AARNINK WAM, HANEKAMP LJ, VANSILFHOUT A: DETERMINATION OF COMPLEX DIELECTRIC FUNCTIONS OF ION-IMPLANTED AND IMPLANTED-ANNEALED AMORPHOUS-SILICON BY SPECTROSCOPIC ELLIPSOMETRY, JOURNAL OF APPLIED PHYSICS 71: (10) pp. 5260-5262. type of document: Journal paper/Article number of independent citations: 77 language: English DOI |
| Number of independent citations to these publications: | 246 |
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